A Leaked Formula To ON-01910 Detected

The cosine function varies only within 2% for this angular range and we can neglect dependence of the SE yield on the ion reflection angle, thus, ��0(��2) = ��0. We factor out the integral sign for the number of primary ions and SE yield and integrate Eq. 1 over ��1 and ��2 to arrive at the expression: [2] According to this expression, the RI signal is determined by the ion reflection coefficient and its angular dependence, the angular distribution of the reflected ions and the angular aperture of the slit diaphragm. We will now consider the effect of all these factors separately. Angular dependence of the ion reflection coefficient The dependence of the reflection coefficient for singly charged He ions see more on the grazing angle as obtained by a Monte Carlo simulation with SRIM software [39] for different materials is depicted in Fig. 8. Note that the SRIM Monte TRIB1 Carlo simulation assumes that the ions are reflected from an amorphous target and all of them are collected by a detector. Figure 8 Dependence of the reflection coefficient of 35 keV He+ on the grazing angle calculated with SRIM software for different materials. As it can be seen in Fig. 8, the ion reflection coefficient is a monotonically decreasing function that tends to the yield of backscattered ions when the grazing angle is greater than 90��. As ��1 approaches zero, the reflection coefficient tends towards unity, implying that for reflection at very low angles nearly all ions will pass over the specimen surface. The highest relative difference ON-01910 concentration in the reflection coefficient for the different materials (i.e., material contrast) is observed at normal incidence, whereas this difference reduces for low grazing angles and the material contrast vanishes. At the same time, the slope of angular dependence on the reflection coefficient is high at low grazing angles and low for normal incidence. This explains why the morphology contrast in the RI images is determined mostly by the surface morphology but not by the surface composition in our experiments. In fact, the RI contrast is determined by the angular dependence of the reflection coefficient only when all of the reflected ions are detected. In turn, this assumption is valid when the halfwidth of the angular aperture is larger than the halfwidth of the RI angular distribution, that is, ���� > �Ħ�, and the sample surface is sufficiently smooth so that |��1?��0| = ��